Process Optimization and Downscaling of a Single Electron Single Dot Memory

Details Process Optimization and Downscaling of a Single Electron Single Dot Memory Process Optimization and Downscaling of a Single Electron Single Dot Memory

2011-06-21

arxiv.org/abs/1106.4289v1

IEEE Transactions On Nanotechnology 8, 9 (2009) 737-748

Physics

Condensed Matter

Materials Science

Scientific paper

10.1109/TNANO.2009.2021653

This paper presents the process optimization of a single-electron nanoflash electron memory. Self-aligned single dot memory structures have been fabricated using a wet anisotropic oxidation of a silicon nanowire. One of the main issue was to clarify the process conditions for the dot formation. Based on the process modeling, the influence of various parameters (oxidation temperature, nanowire shape) has been investigated. The necessity of a sharp compromise between these different parameters to ensure the presence of the memory dot has been established. In order to propose an aggressive memory cell, the downscaling of the device has been carefully studied. Scaling rules show that the size of the original device could be reduced by a factor of 2. This point has been previously confirmed by the realization of single-electron memory devices.

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