Full counting statistics of multiple Andreev reflections

Details Full counting statistics of multiple Andreev reflections Full counting statistics of multiple Andreev reflections

2003-08-04

arxiv.org/abs/cond-mat/0308049v1

Phys. Rev. Lett. 91, 187001 (2003).

Physics

Condensed Matter

Superconductivity

revtex4, 5 pages, 3 figures

Scientific paper

10.1103/PhysRevLett.91.187001

We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges ne (n=1,2,3,...) are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise and high current cumulants in a variety of situations can be obtained from our result.

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