The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension

Details The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension

2002-07-04

arxiv.org/abs/cond-mat/0207137v1

Physical Review E 66, 026127 (2002); 66, 069901(E) (2002)

Physics

Condensed Matter

Statistical Mechanics

accepted for publication in Phys. Rev. E

Scientific paper

10.1103/PhysRevE.66.026127

We investigate the depinning transition for driven interfaces in the random-field Ising model for various dimensions. We consider the order parameter as a function of the control parameter (driving field) and examine the effect of thermal fluctuations. Although thermal fluctuations drive the system away from criticality the order parameter obeys a certain scaling law for sufficiently low temperatures and the corresponding exponents are determined. Our results suggest that the so-called upper critical dimension of the depinning transition is five and that the systems belongs to the universality class of the quenched Edward-Wilkinson equation.

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