Localizing periodicity in near-field images

Details Localizing periodicity in near-field images Localizing periodicity in near-field images

1997-11-28

arxiv.org/abs/cond-mat/9711309v1

Physical Review Letters 64, 9 (1990) 1031-1034

Physics

Condensed Matter

Statistical Mechanics

5 pages (4 figs, 13 refs) RevTeX; apps http://newton.umsl.edu/stei_lab

Scientific paper

10.1103/PhysRevLett.64.1031

We show that Bayesian inference, like that used in statistical mechanics, can guide the systematic construction of Fourier dark-field methods for localizing periodicity in near-field (e.g. scanning-tunneling and electron-phase-contrast) images. For crystals in an aperiodic field, the Fourier coefficient Ze^{i phi} combines with a prior estimate for background amplitude B to predict background phase (beta) values distributed with a probability p(beta - phi | Z,phi,B) inversely proportional to the amplitude P of the signal of interest, when this latter is treated as an unknown translation scaled to B.

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