Fine tuning epitaxial strain in ferroelectrics: PbxSr(1-x)TiO3 on DyScO3

Physics – Condensed Matter – Materials Science

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The following article has been submitted to Applied Physics Letters

Scientific paper

Epitaxial strain can be used to modify the properties of ferroelectric thin films. From the experimental viewpoint, the challenge is to fine-tune the magnitude of the strain. We illustrate how, by using a suitable combination of composition and substrate, the magnitude of the epitaxial strain can be controlled in a continuous manner. The phase diagram of PbxSr1-xTiO3 films grown epitaxially on (110)-DyScO3 is calculated using a Devonshire-Landau approach. A boundary between in-plane and out-of-plane oriented ferroelectric phases is predicted to take place at $x \approx$ 0.8. A series of PbxSr1-xTiO3 films grown by MBE show good agreement with the proposed phase diagram

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