Physics
Optics
Scientist
Perkin-Elmer Corp., Danbury, CT
Hughes Danbury Optical Systems, Inc., Danbury, CT
Image quality prediction of normal-incidence X-ray/EUV multilayers in the presence of substrate and interface fabrication errors.
Imaging capabilities of normal-incidence X-ray telescopes
Transfer function characterization of grazing incidence optical systems
X-ray/EUV multilayers - Promise and pitfalls
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