Statistics – Applications
Scientist
Statistics
Applications
Scientist
Changchun Institute of Optics and Fine Mechanics
18- to 20-nm broadband multilayer at normal incidence
Characterization of Mo/B4C soft x-ray multilayer mirrors for 7.3- to 8.0-nm radiation
Cryogenic target for low-debris soft x-ray generation
Design concepts of EUV telescopes and the detectors boarded on the Solar Space Telescope
Design, fabrication, and characterization of broadband multilayer mirrors for EUV optics at normal incidence
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