Statistics – Methodology
Scientist
Statistics
Methodology
Scientist
LETI / CEA
CEA, Laboratoire d'Electronique et de Technologie de l'Informatique, Grenoble, France
128 X 128 3-5 micron focal plane arrays at 77 K and 200 K operation
320x240 microblometer uncooled IRFPA
640x480 MCT 3- to 5-um snapshot focal plane array
Amorphous silicon technology improvement at CEA-LETI
Uncooled amorphous-silicon technology: high-performance achievement and future trends
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