Formation of lateral-shift speckle interferograms in diffusely scattered fields

Physics

Scientific paper

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Scientific paper

The formation of lateral-shift speckle interferograms that characterize the axial wave aberrations of the optical system used in the coherent matte-screen illumination channel is analyzed in the Fresnel approximation based on coincidence of the objective speckle fields of two exposures in the photoplate plane. It shown theoretically and in experiment that speckle-interferometer sensitivity is doubled at a given lateral shift.

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