Linewidth measurement under poor spectral resolution.

Details Linewidth measurement under poor spectral resolution. Linewidth measurement under poor spectral resolution.

Jan 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996jqsrt..55..149a&link_type=abstract

Journal of Quantitative Spectroscopy and Radiative Transfer, vol. 55, issue 1, pp. 149-150

Physics

Methods Of Observation: Line Profiles

Scientific paper

It is shown that in case of apparatus function with fast decreasing wings, spectral widths of Lorenzian type line profile can be measured even if spectral width of apparatus function is sufficiently wider than a line width. This method can be used for natural line widths measurements for highly ionized atoms in experiments with EBIT type source.

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