Optical constant determination for x-ray materials

Details Optical constant determination for x-ray materials Optical constant determination for x-ray materials

Feb 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2010..211w&link_type=abstract

Proc. SPIE Vol. 2010, p. 211-219, X-Ray and Ultraviolet Polarimetry, Silvano Fineschi; Ed.

Physics

Scientific paper

In the x-ray region of the spectrum, the optical constants of electron
beam vacuum evaporated absorbing thin films are determined by measuring
the reflectance at a number of angles of incidence. A method for
calculating the optical constants through an iteration process of
matching calculated and measured values of the reflectance is described.

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