Polarimetry with use of soft x-ray multilayers

Details Polarimetry with use of soft x-ray multilayers Polarimetry with use of soft x-ray multilayers

Feb 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2010..152y&link_type=abstract

Proc. SPIE Vol. 2010, p. 152-159, X-Ray and Ultraviolet Polarimetry, Silvano Fineschi; Ed.

Physics

2

Scientific paper

Soft x-ray polarimetry and ellipsometry have been made possible by the development of multilayer polarizers and phase shifters. In addition to the reflection type, a free-standing transmission type was also developed. With the polarizing elements, polarization of synchrotron radiation was measured, which revealed that the long axes of polarization ellipses were not horizontal but inclined. With a transmission phase shifter having 80.7 degree(s) phase shift, all normalized Stokes parameters of a partially polarized radiation from a laser produced plasma source were measured under a laboratory condition.

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