Development of a hard x-ray imaging polarimeter

Details Development of a hard x-ray imaging polarimeter Development of a hard x-ray imaging polarimeter

Feb 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2010..118a&link_type=abstract

Proc. SPIE Vol. 2010, p. 118-125, X-Ray and Ultraviolet Polarimetry, Silvano Fineschi; Ed.

Physics

5

Scientific paper

An optical imaging chamber can be used to detect x-rays by imaging the tracks of photoelectrons ejected when the x-rays are absorbed in the detector volume. These tracks contain information about the location of the x-ray interaction point and its polarization. In the lab, we have obtained a modulation factor of 30% for 60 keV polarized x-rays. Here we discuss preliminary work done towards building a large area hard x-ray imaging polarimeter which will be able to measure x-ray polarizations from bright cosmic x-ray sources at energies between 40 keV and 100 keV.

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