Determination of the inhomogeneities of semiconductor materials in the infrared

Details Determination of the inhomogeneities of semiconductor materials in the infrared Determination of the inhomogeneities of semiconductor materials in the infrared

Dec 1982

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1982opmep..49...29b&link_type=abstract

(Optiko-Mekhanicheskaia Promyshlennost, vol. 49, Dec. 1982, p. 29-32) Soviet Journal of Optical Technology (ISSN 0038-5514), vol

Physics

Crystal Defects, Infrared Imagery, Inhomogeneity, Optical Properties, Schlieren Photography, Semiconductors (Materials), Germanium, Mercury Cadmium Tellurides, Single Crystals

Scientific paper

The possibility of using optical methods (direct schlieren, schlieren,
interference) for studying inhomogeneities in IR materials is examined.
The patterns of germanium and cadmium-mercury-tellurium samples,
obtained on a laboratory prototype of an IR schlieren system, are shown.

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