MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications

Details MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications

Jun 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004esasp.554..493p&link_type=abstract

In: Proceedings of the 5th International Conference on Space Optics (ICSO 2004), 30 March - 2 April 2004, Toulouse, France. Ed.:

Physics

Optics

Mstar Sensor

Scientific paper

The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low-frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beam-launching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances and used for space-based applications.

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