Solar EUV Variability as Measured by SOHO EIT and Future Application to SDO SHARPP

Details Solar EUV Variability as Measured by SOHO EIT and Future Application to SDO SHARPP Solar EUV Variability as Measured by SOHO EIT and Future Application to SDO SHARPP

Apr 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003eaeja....13798n&link_type=abstract

EGS - AGU - EUG Joint Assembly, Abstracts from the meeting held in Nice, France, 6 - 11 April 2003, abstract #13798

Physics

Atomic Physics

Scientific paper

The SOHO EIT instrument obtains full disk images of the Sun through four channels; Fe IX,X (17.1nm), Fe XII (19.5nm), Fe XV (28.4nm), and He II (30.4nm). We construct a model differential emission measure (DEM) map, using the EIT images from the four channels, which accurately covers the temperature range 80,000 - 2.2 MK. Using our DEM modeling tool we calculate full disk EUV irradiances over the SOHO mission lifetime. The accuracy of our model is demonstrated with a long term comparison to the SOHO SEM instrument full disk irradiances. We provide a public database (SOHO EIT website) of daily, full disk, full resolution DEM maps from the SOHO EIT data as well as the software to create these maps. Software tools are made available in order to extract the irradiance for any EUV line, or defined passband, or calibrated spectra (using the CHIANTI atomic physics package) for full disk, or smaller regional average, over the entire field of view. The solar EUV variability is an important driver to geospace. Model irradiances from the DEM tools we have developed can be directly applied to thermospheric and ionospheric models, and as input into empirical models such as SOLAR2000 (Tobiska 2000), or used as an effective activity index for such modeling. As part of the public database, we provide a daily EUV irradiance spectrum (covering from 17-35 nm, 1 nm bins) covering the SOHO mission. Lastly, we have begun preliminary work in applying our DEM technique to the upcoming SDO SHARPP instrument. The increased temperature (emission line) coverage for this instrument, especially for the transition region, greatly enhances the fidelity of our models.

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