Laser metrology in the micro-arcsecond metrology testbed

Details Laser metrology in the micro-arcsecond metrology testbed Laser metrology in the micro-arcsecond metrology testbed

Feb 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5634..293a&link_type=abstract

Advanced Sensor Systems and Applications II. Edited by Rao, Yun-Jiang; Kwon, Osuk Y.; Peng, Gang-Ding. Proceedings of the SPIE,

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The Space Interferometer Mission (SIM), scheduled for launch in 2009, is a space-born visible light stellar interferometer capable of micro-arcsecond-level astrometry. The Micro-Arcsecond Metrology testbed (MAM) is the ground-based testbed that incorporates all the functionalities of SIM minus the telescope, for mission-enabling technology development and verification. MAM employs a laser heterodyne metrology system using the Sub-Aperture Vertex-to-Vertex (SAVV) concept. In this paper, we describe the development and modification of the SAVV metrology launchers and the metrology instrument electronics, precision alignments and pointing control, locating cyclic error sources in the MAM testbed and methods to mitigate the cyclic errors, as well as the performance under the MAM performance metrics.

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