WF/PC2 Cycle 4: Preflash Test

Details WF/PC2 Cycle 4: Preflash Test WF/PC2 Cycle 4: Preflash Test

Jul 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994hst..prop.5632c&link_type=abstract

HST Proposal ID #5632

Physics

Hst Proposal Id #5632

Scientific paper

Analysis of Omega Cen calibration fields has revealed what appears to be a variation of ~10% across each CCD in the direction of the columns (parallel register). On the basis of analysis done by the WFPC2 Science Team and STScI we have established the following facts: 1) A variation of ~10% is seen in Omega Cen images across each chip in the direction of the columns (parallel register). 2) This effect is not removed by flat fielding, nor, does it appear to be intrinsic to the flat fields themselves. 3) It is also seen in analysis of cosmic ray events in long dark frames. 4) Pre-assembly engineering data does not appear to show the effect (John Trauger).

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