Half-widths, escape probabilities and intensity factors of opacity-broadened Doppler- and Voigt-profile lines.

Details Half-widths, escape probabilities and intensity factors of opacity-broadened Doppler- and Voigt-profile lines. Half-widths, escape probabilities and intensity factors of opacity-broadened Doppler- and Voigt-profile lines.

Aug 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997jqsrt..58..217k&link_type=abstract

Journal of Quantitative Spectroscopy and Radiative Transfer, vol. 58, issue 2, pp. 217-231

Physics

15

Radiative Transfer: Line Profiles, Radiative Transfer: Scattering

Scientific paper

Half-widths at half-maximum, photon escape probabilities and line-center intensity factors are calculated for lines formed by scattering in the Doppler and Voigt spectral profiles, in homogeneous plane-parallel media. Tables of values, and illustrative figures, are provided for optical thicknesses 0 ≤ τ0 ≤ 100 and Voigt parameters 0 ≤ a ≤ 10. The applicability of the results is discussed and relationships needed for their application are summarized.

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