Excess quantum noise due to mode nonorthogonality in dielectric microresonators

Details Excess quantum noise due to mode nonorthogonality in dielectric microresonators Excess quantum noise due to mode nonorthogonality in dielectric microresonators

2008-09-15

arxiv.org/abs/0809.2349v2

Phys. Rev. A 79, 061801(R) (2009)

Physics

Optics

4 + 2 pages, 1 + 1 figures (text plus supplemental information)

Scientific paper

10.1103/PhysRevA.79.061801

This work presents a theory of the frequency-resolved light emission of active two-dimensional dielectric microresonators, which are characterized by a highly non-paraxial mode structure and frequently feature a position-dependent dielectric constant and non-uniform gain. The Lorentzian intensity profile is characterized by an appropriately generalized Petermann factor, a renormalized peak position, and the cold-cavity resonance lifetime Gamma. The theory also delivers a relation of Gamma to the laser threshold that improves earlier phenomenological expressions even for the case of a homogeneous medium.

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