Properties of a thin metal layer as a tool in focusing (projecting) procedure

Details Properties of a thin metal layer as a tool in focusing (projecting) procedure Properties of a thin metal layer as a tool in focusing (projecting) procedure

2007-02-28

arxiv.org/abs/physics/0702251v3

Physics

Optics

8 pages, 7 figures

Scientific paper

The field of an evanescent wave in a space with a thin metal layer is explored. The wave number of the evanescent wave exceeds many times the wave number of a uniform plane wave in adjoining gaps. In agreement with the results of the Pendry's paper of the 2000 year the field behind the metal layer occurs to be amplified as compared to the field in absence of the metal layer. Pendry has demonstrated the effect for the metal of the dielectric constant of -1. In this paper it is shown that the effect exists for the dielectric constant of -15 and for an arbitrary thickness of the adjoining gaps. This widens the number of possible applications. The metal losses do not destoy the effect appreciably.

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