Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

Details Smart Temperature Sensor for Thermal Testing of Cell-Based ICs Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

2007-10-25

arxiv.org/abs/0710.4733v1

Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Computer Science

Hardware Architecture

Submitted on behalf of EDAA (http://www.edaa.com/)

Scientific paper

In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18$\mu$m CMOS technology show that the non-linearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.

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