Quantum metrology at the Heisenberg limit with ion traps

Details Quantum metrology at the Heisenberg limit with ion traps Quantum metrology at the Heisenberg limit with ion traps

2006-08-09

arxiv.org/abs/quant-ph/0608082v1

New J. Phys. 8 (2006) 276

Physics

Quantum Physics

10 pages, 6 figures

Scientific paper

10.1088/1367-2630/8/11/276

Sub-Planck phase-space structures in the Wigner function of the motional degree of freedom of a trapped ion can be used to perform weak force measurements with Heisenberg-limited sensitivity. We propose methods to engineer the Hamiltonian of the trapped ion to generate states with such small scale structures, and we show how to use them in quantum metrology applications.

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