Simulations of the Temperature Dependence of the Charge Transfer Inefficiency in a High-Speed CCD

Physics – Instrumentation and Detectors

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

8 pages, 5 figures, presented at LCWS'07, DESY

Scientific paper

10.1109/TNS.2007.903180

Results of detailed simulations of the charge transfer inefficiency of a prototype serial readout CCD chip are reported. The effect of radiation damage on the chip operating in a particle detector at high frequency at a future accelerator is studied, specifically the creation of two electron trap levels, 0.17 eV and 0.44 eV below the bottom of the conduction band. Good agreement is found between simulations using the ISE-TCAD DESSIS program and an analytical model for the former level but not for the latter. Optimum operation is predicted to be at about 250 K where the effects of the traps is minimal; this being approximately independent of readout frequency in the range 7-50 MHz. The work has been carried out within the Linear Collider Flavour Identification (LCFI) collaboration in the context of the International Linear Collider (ILC) project.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Simulations of the Temperature Dependence of the Charge Transfer Inefficiency in a High-Speed CCD does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Simulations of the Temperature Dependence of the Charge Transfer Inefficiency in a High-Speed CCD, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Simulations of the Temperature Dependence of the Charge Transfer Inefficiency in a High-Speed CCD will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-200840

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.