X-ray imaging II; Proceedings of the Meeting, San Diego, CA, Aug. 21, 22, 1986

Details X-ray imaging II; Proceedings of the Meeting, San Diego, CA, Aug. 21, 22, 1986 X-ray imaging II; Proceedings of the Meeting, San Diego, CA, Aug. 21, 22, 1986

Jan 1986

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1986spie..691.....k&link_type=abstract

Meeting sponsored by SPIE. Bellingham, WA, Society of Photo-Optical Instrumentation Engineers (SPIE Proceedings. Volume 691), 19

Physics

Optics

Conferences, Imaging Techniques, X Ray Imagery, Absorption Spectra, Metal Films, Plasma Diagnostics, Tomography

Scientific paper

Recent advances in the technology of X-ray imaging are discussed in reviews and reports. Topics addressed include component characteristics, detectors, optics, and applications. Consideration is given to the 1-40-keV photoabsorption cross sections of Fe, Ni, Sn, Ta, Pt, Au, Pb, and U; metal reflectors in the EUV; high-gain microchannel plate detectors for imaging at soft X-ray wavelengths; optics for X-ray astronomy; and the measured performance of a grazing-incidence relay-optics telescope for solar X-ray astronomy.

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