X-ray calibration: Techniques, sources, and detectors; Proceedings of the Meeting, San Diego, CA, Aug. 19, 20, 1986

Details X-ray calibration: Techniques, sources, and detectors; Proceedings of the Meeting, San Diego, CA, Aug. 19, 20, 1986 X-ray calibration: Techniques, sources, and detectors; Proceedings of the Meeting, San Diego, CA, Aug. 19, 20, 1986

Jan 1986

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1986spie..689.....r&link_type=abstract

Meeting sponsored by SPIE. Bellingham, WA, Society of Photo-Optical Instrumentation Engineers (SPIE Proceedings. Volume 689), 19

Physics

Calibrating, Conferences, X Ray Apparatus, X Ray Sources, Bremsstrahlung, Far Ultraviolet Radiation, Laser Plasmas, Linear Arrays, Microscopes, Plasma Diagnostics, Point Sources, Proportional Counters, Standards, Synchrotron Radiation, Tokamak Devices, Ultraviolet Filters, Ultraviolet Telescopes, X Ray Diffraction, X Ray Scattering

Scientific paper

Papers are presented on absolute intensity measurements in the vacuum UV; a Penning discharge source for EUV calibration; a laser produced plasma XUV radiation source; a variable pressure ion chamber for relative and absolute flux measurements; calibration of a 1-m diameter normal incidence EUV telescope/spectrometer; VUV spectrometer-detector system calibration using synchrotron radiation; and Wolter X-ray microscope calibration. Consideration is given to techniques of absolute low energy X-ray calibration; the evaluation of gratings for the Extreme UV Explorer (EUVE); soft X-ray calibration of diffracting materials; and the calibration of the thin film filters for the EUVE. Topics discussed include facilities and techniques for X-ray diagnostic calibration in the 100 eV to 100 KeV energy range; XUV radiometric standards at NBS; Los Alamos X-ray characterization facilities for plasma diagnostics; the calibration of solar EUV instrumentation in space; and direct X-ray response of charge-coupled devices and photodiode linear arrays.

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