Ellipsometric investigations of polished surface of glass/ceramic with ultralow coefficient of the temperature expansion

Physics – Optics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Scientific paper

The results of ellipsometric investigations of surfaces of glassceramic samples with ultra low coefficient of thermal expansion are presented. These glassceramic samples are used in manufacturing of precision parts of optical instruments, for instance for telescope mirrors manufacturing. The aim of these investigations was to study the influence of the surface damaged layer and elastic deformations on the residual ellipticity of polished surfaces of glassceramic samples with ultra low temperature expansion coefficient. It was shown that with increasing of the surface layer polished depth damaged by grinding, the residual ellipticity decreases up to the value that remains a constant. Its value is determined by the material structure and stresses in the surface layer.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Ellipsometric investigations of polished surface of glass/ceramic with ultralow coefficient of the temperature expansion does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Ellipsometric investigations of polished surface of glass/ceramic with ultralow coefficient of the temperature expansion, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ellipsometric investigations of polished surface of glass/ceramic with ultralow coefficient of the temperature expansion will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1821535

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.