Advances on Talbot projection profilometry

Physics – Optics

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Charge-Coupled Devices, Fourier Transform Optics, Image Processing, Optical Elements, Phase Measurement, Optical Elements, Devices, And Systems, Fourier Optics, Image Forming And Processing, Metrological Applications, Optical Frequency Synthesizers For Precision Spectroscopy, Phase Retrieval

Scientific paper

When a periodic screen is illuminated with a monochromatic plane wavefront, it is formed exact replicas of the screen in defined planes along the illumination direction. This phenomenon is known as the Talbot effect or self-imaging. If a Talbot image of a linear grating is formed on a surface structure under study, the grating lines are deformed according to the topography of the structure surface. The deformed fringe image is captured with a CCD camera and processed for obtaining a wrapped phase map by means of the Fourier transform method. From the unwrapped phase map, the profile of the structure surface is obtained. In this work some advances of the Talbot projection profilometry (TPP) are presented, in particular, its use in macro and microscopic experimental mechanics. To macroscopic level, an inverse problem is described. This problem consists on using the TPP technique as a force sensor: Knowing the Young's modulus of a material subjected to a mechanical deformation, determine the field of forces that produce the deformation. From this last procedure, experimental results are shown using a latex membrane as the structure subjected to a uniform load taken place by an applied pressure. Additionally, the detected force limits with the proposed experimental setup are shown.

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