Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS)

Details Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS) Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS)

Sep 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2210..616p&link_type=abstract

Proc. SPIE Vol. 2210, p. 616-624, Space Optics 1994: Space Instrumentation and Spacecraft Optics, Thierry M. Dewandre; Joachim J

Physics

Optics

1

Scientific paper

Spectralon has been proposed as a material for diffuse calibration panels for several satellite-based earth-observing instruments. This paper is an interim report on the ongoing flight qualification testing of this material, including tests of the stability of the material under exposure to atomic oxygen, proton fluences, and UV/VUV radiation which match those of the polar orbit environment. No measurable degradation of optical properties were observed following atomic oxygen exposure or proton bombardment. Under initial UV/VUV exposure tests, some degradation of the optical properties of the material were observed; this optical degradation has been linked to degradation of organic contaminants. Correlative tests (Gas Chromatography/Mass Spectrometry) indicate that such contamination can be prevented by the adoption of a more rigid production protocol. It is believed that elimination of these contaminants will result in a significant improvement in the optical stability of Spectralon under UV/VUV exposure. The validation of this new production protocol will occur during a second phase of UV/VUV testing.

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