Effect of dielectronic recombination on electron-ion scattering cross sections

Details Effect of dielectronic recombination on electron-ion scattering cross sections Effect of dielectronic recombination on electron-ion scattering cross sections

Jul 1981

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1981phrvl..47...79p&link_type=abstract

Physical Review Letters, vol. 47, July 13, 1981, p. 79-82. NSF-supported research.

Physics

45

Electron Scattering, Electron-Ion Recombination, High Temperature Plasmas, Plasma Spectra, Plasma-Particle Interactions, Scattering Cross Sections, Atomic Excitations, Autoionization, Collision Parameters, Collision Rates, Digital Techniques, Electron Impact, Metal Ions, Oxygen Ions, Reactance

Scientific paper

It is shown that the loss of electron scattering flux through dielectronic recombination can be quite significant for highly charged ions, thus reducing the contribution of autoionizing resonances to scattering cross sections and hence excitation rates. This process is likely to be of importance in analyzing line emission from high-temperature plasmas. Detailed calculations are carried out for O(6+) and Fe(24+). Employing the present formulation, the averaged cross sections for dielectronic recombination may also be computed.

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