High-Temperature X-Ray Analysis of the Chalcogenide Glasses in the Multicomponent Sb-As-S-Se-I System

Details High-Temperature X-Ray Analysis of the Chalcogenide Glasses in the Multicomponent Sb-As-S-Se-I System High-Temperature X-Ray Analysis of the Chalcogenide Glasses in the Multicomponent Sb-As-S-Se-I System

Apr 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007aipc..899..653s&link_type=abstract

SIXTH INTERNATIONAL CONFERENCE OF THE BALKAN PHYSICAL UNION. AIP Conference Proceedings, Volume 899, pp. 653-653 (2007).

Physics

Amorphous Semiconductors, Metals, And Alloys, Glasses, X-Ray Diffraction, Solid-Solid Transitions, Glass Transitions

Scientific paper

The elements of structural network of the five-component chalcogenide glasses from the pseudo-binary system (As2Se3)100-x(SbSI)x have been investigated by high-temperature X-ray powder diffraction analysis. Appearance of a large number of structural units in the crystallization processes above glass transition temperature Tg was observed. The DSC experiments shows that the temperature regions of crystallization translates to lower temperatures with increasing SbSI content. Structural unit of SbSI, which in the monocrystal form is a ferroelectric, exists in materials with x>=50 at. %.

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