Thin-film achromatic phase shifters for nulling interferometry: design approach

Details Thin-film achromatic phase shifters for nulling interferometry: design approach Thin-film achromatic phase shifters for nulling interferometry: design approach

Dec 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003apopt..42.6919l&link_type=abstract

Applied Optics, Volume 42, Issue 34, pp. 6919-6928 (2003).

Physics

Optics

Astronomical Telescopes, Infrared Spectroscopy, Light Interferometry, Optical Phase Shifters, Optical Films, Optical Multilayers

Scientific paper

Nulling interferometry in the thermal IR is the most promising technique for direct detection of Earth-like exoplanets. This technique requires a π phase shifter for the parent star of the planet to be completely extinguished by destructive interference. We investigate how thin films can be used to design π achromatic phase shifters. The design approach that we propose works on reflection and can be carried out by two steps, namely, the design of a mirror and an antireflection structure with no constraint on the phase properties of the thin film stacks. Phase-shift accuracy is derived analytically, and a numerical example illustrates this concept.

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