Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays

Details Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays Development of X-ray Polarimeter by Detecting Secondary Fluorescent X-rays

Dec 1972

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1972isasr.489..369k&link_type=abstract

ISAS Research Note, vol.489, p.369-376

Physics

X-Rays: General, Instrumentation: Polarimeters, Techniques: Polarimetric

Scientific paper

A new kind of X-ray polarimeter, which was successfully operated below 2 KeV X-ray, is described. The angular distribution of secondary fluorescent X-rays emitted in the process of photoelectric effect is expected to exhibit an asymmetry correlated with the polarization vector of the initial X-ray. This asymmetrical behavior is utilized for polarization measurement.

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