The X-ray polarisation sensitivity of CCDs

Details The X-ray polarisation sensitivity of CCDs The X-ray polarisation sensitivity of CCDs

Feb 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995nimpa.355..526h&link_type=abstract

Nuclear Instruments and Methods in Physics Research Section A, v. 355, p. 526-531

Physics

9

Scientific paper

The regular array of pixels in a silicon Charge Coupled Device (CCD) may be used to measure photoelectron emission directions following the absorption of high energy X-rays (E > 15 keV). CCDs offer, therefore, the possibility of combining X-ray imaging and spectroscopy with measurement of the linear polarisation of the incident beam. We describe a simple model of electron transport in CCDs which leads to an estimate of the energy-dependent modulation factor M(E) - the parameter determining polarisation sensitivity - for arbitrary pixel geometries. The predictions of the model are in good agreement with published measurements. The sensitivity of an optimised CCD ``pixel polarimeter'' for cosmic X-ray astronomy is assessed.

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