Using synchrotron-based FT-IR microspectroscopy to study the spatial distribution of volatile components in natural diamonds

Details Using synchrotron-based FT-IR microspectroscopy to study the spatial distribution of volatile components in natural diamonds Using synchrotron-based FT-IR microspectroscopy to study the spatial distribution of volatile components in natural diamonds

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003gecas..67q.193k&link_type=openurl

Geochimica et Cosmochimica Acta Supplement, Vol. 67, Issue 18, p.193

Physics

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