Synchrotron Total-Reflection X-Ray Fluorescence (SR-TXRF) of Genesis Return Samples

Details Synchrotron Total-Reflection X-Ray Fluorescence (SR-TXRF) of Genesis Return Samples Synchrotron Total-Reflection X-Ray Fluorescence (SR-TXRF) of Genesis Return Samples

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.2029b&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.2029

Physics

Scientific paper

Synchrotron-based Total-Reflection X-Ray Fluorescence (SR-TXRF) has been
used to measure the surface cleanliness of flown Genesis sapphire sample
pieces. Megasonic UPW cleaning does not increase surface roughness.
Brown stain was found on some, but not all, of the flown sapphire
pieces.

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