X-Ray Diffraction and Fluorescence Measurements for In-situ Planetary Instruments

Details X-Ray Diffraction and Fluorescence Measurements for In-situ Planetary Instruments X-Ray Diffraction and Fluorescence Measurements for In-situ Planetary Instruments

Dec 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010agufm.p53a1497h&link_type=abstract

American Geophysical Union, Fall Meeting 2010, abstract #P53A-1497

Physics

[2194] Interplanetary Physics / Instruments And Techniques, [3672] Mineralogy And Petrology / Planetary Mineralogy And Petrology, [5494] Planetary Sciences: Solid Surface Planets / Instruments And Techniques, [6225] Planetary Sciences: Solar System Objects / Mars

Scientific paper

The X-Ray Diffraction (XRD) instruments are core components of the forthcoming NASA Mars Science Laboratory (MSL) and ESA/NASA EXOMARS missions and will provide the first demonstrations of an XRF/XRD instrument’s capabilities in-situ on an extraterrestrial planetary surface. The University of Leicester team is part of the Italy-UK collaboration that is responsible for building the ExoMars X-Ray Diffraction instrument, Mars XRD. The ExoMars X-ray diffraction instrument incorporates an 55-Fe radioisotope source and three fixed-position CCDs to simultaneously acquire an X-Ray fluorescence spectrum and a diffraction pattern providing a measurement of both elemental and mineralogical composition [1]. The CCDs cover an angular range from 6 to 65-deg enabling the analysis of silicates, from clays, or other phyllosilicates characterised by varying d-spacings, to oxides, and carbonates or evaporites. The identification of hydrous minerals may help identify past Martian hydrothermal systems capable of preserving traces of life. Here we present some initial findings from XRF and XRD tests carried out at the University of Leicester using an 55-Fe source and X-ray sensitive CCD [1]. The XRD/XRD test system consists of a single CCD on a motorised arm, an 55-Fe X-ray source, source collimator and a sample table which approximately replicate the reflection geometry of the XRD instrument. It was used to test geological reference standard materials and Martian analogues. Incidence angle and CCD angles on both the diffraction and fluorescence results were evaluated. A key area of interest is the effect of sample roughness on the XRD/XRF results. We present results from testing pressed powder pellet samples of varying surface roughness, and a comparison with model results [2]. So far we have found that increased roughness causes a reduced intensity at lower take-off angles. Several methods for measuring surface roughness of the samples have been used including an Alicona Infinite Focus microscope. [1] Marinangeli et al. (2007) LPSC #1322 [2] Hansford et al. (2010) EGU General Assembly 2010

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