Radiation damage in the Chandra x-ray CCDs

Details Radiation damage in the Chandra x-ray CCDs Radiation damage in the Chandra x-ray CCDs

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4012..720p&link_type=abstract

Proc. SPIE Vol. 4012, p. 720-730, X-Ray Optics, Instruments, and Missions III, Joachim E. Truemper; Bernd Aschenbach; Eds.

Physics

Optics

14

Scientific paper

Front side illuminated CCDs comprising focal plane of Chandra X-ray telescope have suffered some radiation damage in the beginning of the mission. Measurements of CTI and dark current at different temperatures led us to conclusion that the type of damage is inconsistent with the much studied type of damage created by protons with energies higher than 10 MeV. Intensive ground based investigation showed that irradiation of CCD with low energy protons (about 100 keV) results in the device characteristics very similar to the ones of the flight chips (very low dark current, the shape of the CTI temperature dependence). We were able to reliably determine that only image section of the flight chips was damaged and therefore only fast transfer from image to frame store section was affected. We have developed several techniques in order to determine the parameters of the electron traps introduced into the transfer channel of the irradiated device.

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