Optical design for testing and aligning lightweight grazing incidence x-ray mirrors

Details Optical design for testing and aligning lightweight grazing incidence x-ray mirrors Optical design for testing and aligning lightweight grazing incidence x-ray mirrors

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4012..712z&link_type=abstract

Proc. SPIE Vol. 4012, p. 712-719, X-Ray Optics, Instruments, and Missions III, Joachim E. Truemper; Bernd Aschenbach; Eds.

Physics

Optics

Scientific paper

Test and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc- minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It allow us to test and align thin X-ray mirrors to an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

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