COS Science Data Buffer Check/Self-Tests for CS Buffer RAM and DIB RAM

Details COS Science Data Buffer Check/Self-Tests for CS Buffer RAM and DIB RAM COS Science Data Buffer Check/Self-Tests for CS Buffer RAM and DIB RAM

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008hst..prop11354w&link_type=abstract

HST Proposal ID #11354. Cycle 17

Physics

Scientific paper

The COS Science Buffer RAM is checked for bit flips during SAA passages. This is followed by a Control Section {CS} self-test consisting of writing/reading a specified bit pattern from each memory location in Buffer RAM and a similar test for DIB RAM. The DIB must be placed in BOOT mode for its self-test. The CS Buffer RAM self-test as well as the bit flip tests are all done with the CS in Operate. Supports Activity COS-03;

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