Thickness of ridged plains materials in Hesperia Planum, Mars

Details Thickness of ridged plains materials in Hesperia Planum, Mars Thickness of ridged plains materials in Hesperia Planum, Mars

Apr 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985pggp.rept..242d&link_type=abstract

In NASA, Washington Repts. of Planetary Geol. and Geophys. Program p 242-244 (SEE N85-23474 13-91)

Physics

Landforms, Mars Surface, Plains, Planetary Geology, Thickness, Correlation Coefficients, Lava, Substrates

Scientific paper

The thickness distribution of plains-forming materials in Hesperia Planum is determined by the diameter of partially buried craters. As with all Martian thickness studies, the distribution of measured thicknesses is sparse due to a low number of suitable partially buried craters. The resulting isopach of plains materials has a low level of confidence but is sufficient for generalized thickness trends. The mean of the thickness estimates is 360 + or - 120 m. The isopach of plains-forming materials exhibits an uneven thickness distribution. Average thickness, determined by grid sampling over the region, is 216 + or - 153 m. Local lenses exceed 500 m. A fifth order trend surface provides a partial match (coefficient of correlation = 0.657) to the isopach.

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