Thin Films as Dust Detectors

Details Thin Films as Dust Detectors Thin Films as Dust Detectors

Jan 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007esasp.643..201c&link_type=abstract

Workshop on Dust in Planetary Systems (ESA SP-643). September 26-30 2005, Kauai, Hawaii. Editors: Krueger, H. and Graps, A., p.2

Physics

Scientific paper

Between 2002 and 2004, witness samples of 60 nm thick, aluminum films were exposed to the International Space Station's external environment. On retrieval these films were found to have been perforated extensively by impacting particles, whose inferred diameters are tens of nanometres. This size regime, whether natural dust or man made debris, is almost two orders of magnitude smaller than has previously been measured with conventional instrumentation. We report here on the ongoing characterization of the exposed films and work to develop future thin film experiments for the detection of interplanetary dust.

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