Industrial applications on reflective or translucent samples of a novel automated Meuller-matrix scatterometer

Details Industrial applications on reflective or translucent samples of a novel automated Meuller-matrix scatterometer Industrial applications on reflective or translucent samples of a novel automated Meuller-matrix scatterometer

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121..454d&link_type=toc

Proc. SPIE Vol. 3121, p. 454-464, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipm

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