Measuring the depth of the contaminant on ACIS with a LETG/ACIS-S observation of Mkn 421

Details Measuring the depth of the contaminant on ACIS with a LETG/ACIS-S observation of Mkn 421 Measuring the depth of the contaminant on ACIS with a LETG/ACIS-S observation of Mkn 421

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003cxo..prop.1624c&link_type=abstract

Chandra Proposal ID #05708175

Physics

Chandra Proposal Id #05708175

Scientific paper

With a 50 ksec LETG/ACIS-S observation of Mkn 421, we can measure 1) the C-K optical depth of the contaminant very accurately for testing asymptotic vs linear models, 2) the O-K edge, which, by taking the difference with the previous observation in October 2002, can tell us the shape of the O-K edge in the contaminant better than currently modeled, 3) the time dependence of the F-K edge, which is barely detected in the PKS 2155 observation, and 4) the EXAFS of the C-K and O-K edges can be verified in order to better extrapolate the opacities.

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