Mapping the Depth of the Contaminant on the ACIS Filters with Abell 11795

Details Mapping the Depth of the Contaminant on the ACIS Filters with Abell 11795 Mapping the Depth of the Contaminant on the ACIS Filters with Abell 11795

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003cxo..prop.1613c&link_type=abstract

Chandra Proposal ID #05808164

Physics

Chandra Proposal Id #05808164

Scientific paper

The spatial distribution of the contaminant on ACIS must be measured before any bake-out. The calibration team has developed a scheme that will measure the depth of the contaminant to an accuracy of 3% on scales of 1 arcminute with a raster scan of the rich cluster A1795. This plan consists of 2 observations on ACIS-I and 3 observations on ACIS-S at different chipy locations. These observations have already been approved by the directors office and project science.

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