Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Flown Array Samples

Details Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Flown Array Samples Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Flown Array Samples

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.1420c&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.1420

Physics

4

Scientific paper

Spectroscopic ellipsometry models are discussed that determine accurate
thickness measurements of thin-film contamination on Genesis mission
flown collector array materials.

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