Physics
Scientific paper
Mar 2012
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2012njph...14c3029j&link_type=abstract
New Journal of Physics, Volume 14, Issue 3, pp. 033029 (2012).
Physics
Scientific paper
Located beyond the resolution limit of nanoindentation, contact resonance atomic force microscopy (CR-AFM) is employed for nano-mechanical surface characterization of single crystalline 14M modulated martensitic Ni–Mn–Ga (NMG) thin films grown by magnetron sputter deposition on (001) MgO substrates. Comparing experimental indentation moduli—obtained with CR-AFM—with theoretical predictions based on density functional theory (DFT) indicates the central role of pseudo plasticity and inter-martensitic phase transitions. Spatially highly resolved mechanical imaging enables the visualization of twin boundaries and allows for the assessment of their impact on mechanical behavior at the nanoscale. The CR-AFM technique is also briefly reviewed. Its advantages and drawbacks are carefully addressed.
Jakob A. M.
Mayr S. G.
Müller Marcus
Rauschenbach B.
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