Techniques for Ion Microprobe Analysis of Tiny Particles: Combination of FIB Marking and ^1^6O^- Ion Imaging and Sample Mounts Using Indium

Details Techniques for Ion Microprobe Analysis of Tiny Particles: Combination of FIB Marking and ^1^6O^- Ion Imaging and Sample Mounts Using Indium Techniques for Ion Microprobe Analysis of Tiny Particles: Combination of FIB Marking and ^1^6O^- Ion Imaging and Sample Mounts Using Indium

Mar 2012

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2012lpi....43.2216n&link_type=abstract

43rd Lunar and Planetary Science Conference, held March 19–23, 2012 at The Woodlands, Texas. LPI Contribution No. 1659, id.2216

Physics

2

Scientific paper

We developed new analytical protocols for high-precision oxygen-isotope
analyses of tiny particles: use of indium to mount microtomed potted
butt samples and combination of FIB marking and ^1^6O^- secondary
ion imaging.

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