X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Details X-ray study of W/Si multilayers for the HEFT hard x-ray telescope X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Feb 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5168...41m&link_type=abstract

Optics for EUV, X-Ray, and Gamma-Ray Astronomy. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5

Physics

Optics

1

Scientific paper

This paper outlines an in-depth study of the W/Si coated mirrors for the High Energy Focusing Telescope (HEFT). We present data taken at 8, 40 and 60 keV obtained at the Danish Space Research Institute and the European Synchrotron Radiation Facility in Grenoble. The set of samples were chosen to cover the parameter space of sample type, sample size and coating type. The investigation includes a study of the interfacial roughness across the sample surface, as substrates and later as coated, and an analysis of the roughness correlation in the W/Si coatings for N = 10 deposited bilayers. The powerlaw graded flight coating for the HEFT mirrors is studied for uniformity and scatter, as well as its performance at high energies.

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