X-ray spectroscopy with silicon pin and avalanche photo diodes

Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Avalanche Diodes, Photodiodes, X Ray Spectroscopy, P-I-N Junctions, Silicon, Technology Assessment

Scientific paper

Results of an evaluation of silicon P-Intrinsic-N (PIN) photodiodes and Avalanche Photodiodes (APD) for the direct detection of soft x rays from 1 to 20 keV and for the detection of scintillation light output from CsI(TI) for higher x ray energies (30 to 1000 keV) are presented. About one keV resolution was achieved at room temperature for both the PIN and APD detectors for soft x rays (1 to 20 keV). Commercially available, low power (18 mV), low noise, hybrid preamplifiers, were used. These photodiodes were also coupled to CsI(TI) scintillator and obtained about 6 resolution at 662 keV. The photodiode frequency response matches well with the emission spectrum of the CsI(TI) scintillator providing good spectral resolution and a higher signal than NaI(TI) when viewed by conventional photomultipliers. A PIN-CsI(TI) combination provides a low energy threshold of around 60 keV while for the APD-CsI(TI) it is 15 keV.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

X-ray spectroscopy with silicon pin and avalanche photo diodes does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with X-ray spectroscopy with silicon pin and avalanche photo diodes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray spectroscopy with silicon pin and avalanche photo diodes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1114428

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.